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Andor Technology iKon-M PV Inspector Series Back Illuminated CCD, Deep Depletion with fringe *NEW* Microscope Camera

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Andor Technology iKon-M PV Inspector Series Back Illuminated CCD, Deep Depletion with fringe *NEW* Microscope Camera

Andor Technology iKon-M PV Inspector Series Back Illuminated CCD, Deep Depletion with fringe *NEW* Microscope Camera

Cambridge Scientific ID #: 16355

Andor’s iKon-M 934 series cameras are designed to offer the ultimate in high-sensitivity, low noise performance, ideal for demanding imaging applications. These high resolution 1024 x 1024 CCD cameras boast up to 95% QEmax, high dynamic range, 13 μm pixels and exceptionally low readout noise. The iKon-M benefits from negligible dark current with industry-leading thermoelectric cooling down to -100°C. The ‘Deep Depletion’ sensor option offers ultimate performance for NIR applications, the new Dual AR coating extends the QE performance significantly across the UV/visible region of the spectrum for the broadest possible spectral coverage from one sensor. Fringe Suppression Technology radically minimizes etaloning effects in the NIR. Rapid vertical shifts combined with fast kinetics acquisition mode, comprehensive trigger modes and custom coated wedge window options, render the deep Depletion models ideal for NIR

optimized Bose Einstein Condensation applications.

 

Features and Benefits:

  • Extended range Dual-AR option: Superior UV-NIR broadband back-illuminated QE
  • TE cooling to -100°C: Critical for elimination of dark current
  • Fringe Suppression Technology: NIR etaloning greatly reduced (BR-DD and BEX2-DD sensor types)
  • Up to 5 MHz pixel readout: High frame rates achievable
  • Ultra low noise readout: Intelligent low-noise electronics offer the most ‘silent’ system noise performance available
  • UltraVac: Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance, year after year
  • 13 x 13 μm pixel size: Optimal balance of dynamic range and resolution
  • Integrated shutter: C-mount shutter as standard. Closed during readout to avoid vertical smear
  • Cropped Sensor Mode: Specialized acquisition mode for continuous imaging with fastest possible temporal resolution
  • Enhanced Baseline Clamp: Quantitative accuracy of dynamic measurements
  • USB 2.0 connection: Simple Plug & Play connection
  • Integrated in EPICS: Platform is fully integrated into the EPICS control software

 

Specifications:

  • Active pixels: 1024 x 1024
  • Sensor size: 13.3 x 13.3 mm
  • Pixel size (W x H): 13 μm x 13 μm
  • Active area pixel well depth: 100,000 e- (130,000 e- for BR-DD and BEX2-DD models)
  • Pixel readout rates (MHz): 5, 3, 1, 0.05
  • Read noise: 2.9 e-
  • Maximum cooling: -100°C
  • Frame rate: 4.4 fps (full frame)
  • System window type: UV-grade fused silica, ‘Broadband VUV-NIR’, wedged
  • Interface: USB 2.0
In Stock Worldwide Shipping Call: 1-877-Used-Lab

Our used lab equipment is fully refurbished, guaranteed to work up to manufacturers specifications and are delivered to our customers in as close to new condition as possible. Typical turnaround for refurbishing of used lab equipment is 2-4 weeks. They also come with our standard 6 Month parts and labor warranty. Prices do not include S/H unless otherwise indicated. Pictures enclosed and the actual unit may vary unless specified.

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Thank you for your interest in the Andor Technology iKon-M PV Inspector Series Back Illuminated CCD, Deep Depletion with fringe *NEW* Microscope Camera (ID #: 16355). To speak with a representative, please fill out the contact form below or call us directly.