Description
By combining white light with a laser light source, LSCMs are able to scan a surface and collect both an optical image and high-resolution surface data. Nanometer-level heights can be measured by analyzing the intensity of the returned laser light relative to the z-position of the laser.
Simply place your sample on the stage, click measure, and the VK-X1000 will automatically scan and measure your sample. Our advanced analysis software will automatically analyze the data and recommend key roughness parameters to evaluate.
